VOLTAGE VARIATIONS ARE A MAJOR CHALLENGE IN PROCESSOR DESIGN .H ERE, RESEARCHERS CHARACTERIZE THE VOLTAGE NOISE CHARACTERISTICS OF PROGRAMS AS THEY RUN TO COMPLETION ON A PRODUCTION CORE 2D UO PROCESSOR. FURTHERMORE, THEY CHARACTERIZE THE IMPLICATIONS OF RESILIENT ARCHITECTURE DESIGN FOR VOLTAGE VARIATION IN FUTURE SYSTEMS.
international symposium on microarchitecture(2011)
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要