Methodology for Solder-Joint Lifetime Prediction of LED-Based PCB Assemblies

IEEE Transactions on Device and Materials Reliability(2018)

引用 6|浏览39
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摘要
A solder-joint crack due to thermal fatigue affects the reliability of light emitting diode assemblies. A new methodology is presented for the solder-joint lifetime estimation under a wide range of working conditions. The proposed method is based on the combination of reliability design of experiments, computer aided structural analysis validated by thermal-cycling experiments, and surface respons...
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关键词
Light emitting diodes,Strain,Finite element analysis,Soldering,Mathematical model,Plastics,Fatigue
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