A Temperature-Aware Reliability Enhancement Strategy for 3D Charge-Trap Flash Memory

Wang Yi, Huang Jiangfan,Yang Jing,Li Tao

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems(2019)

引用 11|浏览40
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摘要
Compared to the conventional planar flash memory, advanced 3-D flash memory adopts charge-trap technology that can significantly enhance cell density and storage capacity. Despite these advantages, 3-D charge-trap flash memory brings several new challenges. First, charge-trap flash is sensitive to temperature. Recent studies demonstrate that, the high temperature will incur both charge loss and re...
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关键词
Three-dimensional displays,Reliability,Mathematical model,Temperature sensors,Memory management,Resource management,Temperature distribution
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