Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems.

Microelectronics Reliability(2017)

引用 6|浏览37
暂无评分
摘要
Assessing electronic systems' reliability using prediction handbooks (e.g. MIL-HDBK-217) can lead to wrong reliability predictions due to the assumption of a constant failure rate and the inaccuracy of the proposed semi-empirical models. Despite different initiatives since the last version of the most popular handbook MIL-HDBK-217 (1995) no fundamental improvement was realised that makes use of non-constant failure rate statistics – mandatory to model wear-out - and first principles based Physics-of-Failure modelling.
更多
查看译文
关键词
Reliability,Physics of failure,Design for reliability,Prediction handbooks
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要