Localizing Multiple Faults in Simulink Models

2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER)(2016)

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摘要
As Simulink is a widely used language in the embedded industry, there is a growing need to support debugging activities for Simulink models. In this work, we propose an approach to localize multiple faults in Simulink models. Our approach builds on statistical debugging and is iterative. At each iteration, we identify and resolve one fault and re-test models to focus on localizing faults that might have been masked before. We use decision trees to cluster together failures that satisfy similar (logical) conditions on model blocks or inputs. We then present two alternative selection criteria to choose a cluster that is more likely to yield the best fault localization results among the clusters produced by our decision trees. Engineers are expected to inspect the ranked list obtained from the selected cluster to identify faults. We evaluate our approach on 240 multi-fault models obtained from three different industrial subjects. We compare our approach with two baselines: (1) Statistical debugging without clustering, and (2) State-of-the-art clustering-based statistical debugging. Our results show that our approach significantly reduces the number of blocks that engineers need to inspect in order to localize all faults, when compared with the two baselines. Furthermore, with our approach, there is less performance degradation than in the baselines when increasing the number of faults in the underlying models.
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关键词
Fault localization,statistical debugging,machine learning,decision trees,Simulink models
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