DFM/DFY practices during physical designs for timing, signal integrity, and power
Yokohama（2007）
摘要
We present our experience of DFM (design for manufacturability) and DFY (design for yield) considerations on physical designs at 0.13 mum and below technology nodes. The impact of some DFM approaches on timing and signal integrity are addressed. We also present our experience of yield analysis and improvement for the designs with process variation and dynamic IR drop issues.
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关键词
process variation,dfm,technology node,dfy practice,dfy,timing integrity,dfm approach,design for manufacturability,physical design,timing,physical designs,yield analysis,design for manufacture,design for yield,integrated circuit design,integrated circuit yield,manufacturing processes,signal integrity,dynamic ir drop,0.13 micron,dynamic ir drop issue
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