Design for Resilience to Soft Errors and Variations

Ming Zhang,T. M. Mak,Jim Tschanz,Kee Sup Kim,Norbert Seifert,Davia Lu

Crete（2007）

引用 26|浏览2

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摘要

This paper presents adaptive variation-and-error-resilient agent (AVERA), an approach to address the challenge of designing reliable systems in the presence of soft errors and variations. AVERA extends our previous built-in soft error resilience (BISER) approach by adding additional capabilities to support process variation diagnosis, degradation detection, and system adaptation, besides soft error correction. We also discuss open challenges for building variation-and-error-resilient systems.

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关键词

cmos integrated circuits,degradation detection,previous built-in soft error,reliable system,system adaptation,cmos technology,open challenge,built-in soft error resilience approach,integrated circuit design,resilient agent,additional capability,adaptive variation-and-error,soft errors,adaptive variation-and-error- resilient agent,soft error correction,error correction,soft error,process variation diagnosis,resilience,process variation,human computer interaction,threshold voltage,circuits,transistors,degradation

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